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The DX55 is the ideal incident light microscope for routine metallurgical applications, including materials analysis, metal processing and building materials. It provides the perfect solution for a wide range of materials analysis, metal processing and quality control applications, offering superb performance and versatility. Simple operating procedures ensure outstanding effectiveness in all routine metallurgical work, making the DX55 the natural choice for the exacting demands of the busy materials laboratory.
Optional patented Expanded-Pupil eyepieces offer users advanced ergonomics by providing significant eye relief compared to conventional binocular microscopes. A small movement of the eye no longer means losing the field of view - users can simply move their eyes to view the full image area. The increased eye relief additionally allows spectacles or contact lenses to be worn in comfort.
- Optics offer superb image contrast and resolution
- Patented Expanded-Pupil technology reduces eyestrain and fatigue
- Incident light brightfield
- Incident darkfield
- Polarized light
- Compact design for maximum stability
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